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Tester Equipment
Hachioji-shi, Tokyo, JPN
Event ID #:GI-Event 29324
Lot#: 29518-35
Watch
1-cup Plating System, Automatic Remover, Vacuum Ba...
Lot#: 29518-33
Plasma-Therm 'SLR Series' PCVD
Lot#: 29518-8
Samco 'RIE-10NR' Etcher (1988)
Lot#: 29518-7
Etcher Equipment
Lot#: 29518-15
Nanometrics 'NanoSpec/AFT' Film Thickness Measurem...
Lot#: 29518-14
Double-sided Aligner, Ion Milling System, Automati...
Lot#: 29518-27
Nikon 'NSR-2205i11D' Stepper System
Lot#: 29518-1
SPTS Technologies 'APM-011' InP ICP Etcher (2016)
Lot#: 29518-5
Temperature Chamber, PF Auto Prober, Vacuum Packer...
Lot#: 29518-28
Advantest 'F5112' E-BEAM Lithography System (2001)
Lot#: 29518-3
Screen 'D-spin' Coater
Lot#: 29518-10
Ulvac 'NE-700' Dry Etching System (1998)
Lot#: 29518-6
Cascade Microtech 'Summit 12000' Prober Station Sy...
Lot#: 29518-21
Probe Station, Surface Prober Tester & Surface PD ...
Lot#: 29518-34
Cascade Microtech '12000' Prober Station System 6#
Lot#: 29518-17
Nissin 'Exceed 2000' Ion Implanter
Lot#: 29518-4
Fully Automatic Wafer Probing Machine, SEMI-Automa...
Lot#: 29518-12
Perkin Elmer 'PHI 670' AES Surface Analysis System
Lot#: 29518-29
Measurement Equipment
Lot#: 29518-25
Cascade Microtech '12000' Prober Station System 2#
Lot#: 29518-22
Cascade Microtech 'Summit 12000B' Prober Station S...
Lot#: 29518-24
Cascade Microtech 'S300' Prober Station System 12#
Lot#: 29518-19
Topcon 'WM-1700' Wafer Surface Partical Measuring ...
Lot#: 29518-13
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