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Location:
Białogard, Zachodniopomorskie, POLRemoval & Shipping:
Buyer Must Arrange. See details.
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Shipping Available | See detailsWATCHERS: 1 |VISITORS: 35
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Seller's Terms & Conditions
KLA Tecnor
Omnimap RS75TC
20948-284
Used/See Description
Used wafer test and measurement system from a semiconductor production environment. Ideal for process monitoring, R&D labs, and thin-film characterization on 8" wafers.
Key facts
Model: KLA-Tencor Omnimap RS75TC
Type: Wafer test & measurement system (resistivity / thin film mapping)
Year of manufacture: 1999
Wafer size: Up to 8" (200 mm)
USED, IN GOOD VISUAL CONDITION, NOT TESTED.
Packing and preparation for shipment available upon request.
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